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| XRT |
X-Ray Telescope - Calibration Information |
XRT Through-put
Based on the data circulated by M. Weber on November 18, 2005.
XRT Filters
| Name |
Metal |
Substrate |
FW / Slot |
| Material |
Thickness(*) |
Material |
Thickness(*)/ Trans. |
| Pre-Filter: |
| Al/Poly |
Al |
1200 Å |
Polyimide |
2500 Å |
- |
| Focal-Plane Filters: |
| Thin Al/Mesh |
Al |
1600 Å |
Mesh |
82 % |
FW-2 / Slot 1 |
| Thin Al/Poly |
Al |
1600 Å |
Polyimide |
2500 Å |
FW-1 / Slot 1 |
| C/Poly |
C |
7000 Å |
Polyimide |
2500 Å |
FW-1 / Slot 2 |
| Ti/Poly |
Ti |
3000 Å |
Polyimide |
2500 Å |
FW-2 / Slot 2 |
| Thin Be |
Be |
9 um |
- |
100 % |
FW-1 / Slot 3 |
| Med Be |
Be |
30 um |
- |
100 % |
FW-1 / Slot 4 |
| Med Al |
Al |
12.5 um |
- |
100 % |
FW-1 / Slot 5 |
| Thick Al |
Al |
25 um |
- |
100 % |
FW-2 / Slot 4 |
| Thick Be |
Be |
300 um |
- |
100 % |
FW-2 / Slot 5 |
| White Light |
SiO2 |
2.5 mm |
- |
- |
FW-2 / Slot 3 |
(*) Design values.
Wavelength Bandpass
Temperature Response
Count Rate for Solar Structures (DN/pixel)
| Target |
Quiet Sun |
Active Region |
M2 class Flare |
Coronal Hole |
| Exposure (sec) |
32.0 |
11.3 |
4.0 |
0.5 |
0.004 |
0.001 |
64.0 |
45.2 |
| Thin-Al/Mesh |
850 |
300 |
sat. |
949 |
sat. |
sat. |
175 |
124 |
| Thin-Al/Poly |
394 |
139 |
sat. |
894 |
sat. |
sat. |
23 |
16 |
| C/Poly |
209 |
74 |
sat. |
544 |
sat. |
sat. |
5 |
3 |
| Ti/Poly |
161 |
57 |
sat. |
386 |
sat. |
sat. |
5 |
3 |
| Thin-Be |
44 |
15 |
1632 |
204 |
sat. |
sat. |
0 |
0 |
| Med-Be |
5 |
2 |
219 |
27 |
sat. |
1419 |
0 |
0 |
| Med-Al |
3 |
1 |
111 |
14 |
2477 |
619 |
0 |
0 |
| Thick-Al |
0 |
0 |
14 |
2 |
361 |
90 |
0 |
0 |
| Thick-Be |
0 |
0 |
0 |
0 |
23 |
6 |
0 |
0 |
Based on the XRT data provided by M. Weber on November 18, 2005 and CHIANTI database VERSION 5.2.
The references of the model DEMs: "Quiet Sun" ,
"Active Region" and "Coronal Hole" are from Vernazza & Reeves (1978), and "M2 class Flare" is from Dere & Cook (1979).
The saturation occurs, when the count rate is over 3000DN.
XRT Camera Data
Based on "SOLAR-B Soft X-ray Telescope (XRT) Flight CCD
Camera System (XRT-S, XRT-E) Data Packege".
| Item |
Description |
| CCD camera gain |
R-port: 59.1 + 0.026 T (oC) [el/DN] |
| L-port: 58.8 + 0.034 T (oC) [el/DN] |
| Dark current figure of merit |
0.4 [nA/cm2] |
Charge transfer efficiency (CTE) (–93 oC <
T < –50 oC) |
Parallel transfer: > 0.999996 |
| Serial transfer: > 0.999999 |
| Output linearity |
Deviation less than 1 % up to 3000 DN |
| Full well capacity |
2.0x105 [el] |
| Quantum efficiency (QE)(*) |
0.93 @ 13Å, 0.61 @ 45Å, 0.46 @ 114Å, 0.56 @ 304Å |
| Flatness in CCD sensitivity |
Deviation less than 5%. |
(*) Tentative; absolute
measurement on the QE of the reference SSD used in the calibration to be
performed.
XRT Documents @ SAO
Last revised: 11-Sep-2006 (JK,NN,RK)
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