XRT Through-put
Based on the data circulated by M. Weber on November 18, 2005.
XRT Filters
Name | Metal | Substrate | FW / Slot | ||
---|---|---|---|---|---|
Material | Thickness(*) | Material | Thickness(*)/ Trans. | ||
Pre-Filter: | |||||
Al/Poly | Al | 1200 Å | Polyimide | 2500 Å | - |
Focal-Plane Filters: | |||||
Thin Al/Mesh | Al | 1600 Å | Mesh | 82 % | FW-2 / Slot 1 |
Thin Al/Poly | Al | 1600 Å | Polyimide | 2500 Å | FW-1 / Slot 1 |
C/Poly | C | 7000 Å | Polyimide | 2500 Å | FW-1 / Slot 2 |
Ti/Poly | Ti | 3000 Å | Polyimide | 2500 Å | FW-2 / Slot 2 |
Thin Be | Be | 9 um | - | 100 % | FW-1 / Slot 3 |
Med Be | Be | 30 um | - | 100 % | FW-1 / Slot 4 |
Med Al | Al | 12.5 um | - | 100 % | FW-1 / Slot 5 |
Thick Al | Al | 25 um | - | 100 % | FW-2 / Slot 4 |
Thick Be | Be | 300 um | - | 100 % | FW-2 / Slot 5 |
White Light | SiO2 | 2.5 mm | - | - | FW-2 / Slot 3 |
(*) Design values.
Wavelength Bandpass
Temperature Response
Count Rate for Solar Structures (DN/pixel)
Target | Quiet Sun | Active Region | M2 class Flare | Coronal Hole | ||||
---|---|---|---|---|---|---|---|---|
Exposure (sec) | 32.0 | 11.3 | 4.0 | 0.5 | 0.004 | 0.001 | 64.0 | 45.2 |
Thin-Al/Mesh | 850 | 300 | sat. | 949 | sat. | sat. | 175 | 124 |
Thin-Al/Poly | 394 | 139 | sat. | 894 | sat. | sat. | 23 | 16 |
C/Poly | 209 | 74 | sat. | 544 | sat. | sat. | 5 | 3 |
Ti/Poly | 161 | 57 | sat. | 386 | sat. | sat. | 5 | 3 |
Thin-Be | 44 | 15 | 1632 | 204 | sat. | sat. | 0 | 0 |
Med-Be | 5 | 2 | 219 | 27 | sat. | 1419 | 0 | 0 |
Med-Al | 3 | 1 | 111 | 14 | 2477 | 619 | 0 | 0 |
Thick-Al | 0 | 0 | 14 | 2 | 361 | 90 | 0 | 0 |
Thick-Be | 0 | 0 | 0 | 0 | 23 | 6 | 0 | 0 |
Based on the XRT data provided by M. Weber on November 18, 2005 and CHIANTI database VERSION 5.2. The references of the model DEMs: "Quiet Sun" , "Active Region" and "Coronal Hole" are from Vernazza & Reeves (1978), and "M2 class Flare" is from Dere & Cook (1979). The saturation occurs, when the count rate is over 3000DN.
XRT Camera Data
Based on "SOLAR-B Soft X-ray Telescope (XRT) Flight CCD Camera System (XRT-S, XRT-E) Data Packege".
Item | Description |
---|---|
CCD camera gain | R-port: 59.1 + 0.026 T (oC) [el/DN] |
L-port: 58.8 + 0.034 T (oC) [el/DN] | |
Dark current figure of merit | 0.4 [nA/cm2] |
Charge transfer efficiency (CTE) (-93 oC < T < -50 oC) |
Parallel transfer: > 0.999996 |
Serial transfer: > 0.999999 | |
Output linearity | Deviation less than 1 % up to 3000 DN |
Full well capacity | 2.0x105 [el] |
Quantum efficiency (QE)(*) | 0.93 @ 13Å, 0.61 @ 45Å, 0.46 @ 114Å, 0.56 @ 304Å |
Flatness in CCD sensitivity | Deviation less than 5%. |
(*) Tentative; absolute measurement on the QE of the reference SSD used in the calibration to be performed.
Last revised: 21-July-2016